A quality nanoscale researh tool, NovaSEM Scanning Electron Microscope (SEM), with low-vaccum capibility was recently installed at the Material Characterization Laboratory at the Center for Engineering Research. The microscope is ideal for diverse imaging, analytical and sample preparation demands found in research labs.
The FEI Nova NanoSEM line SEM provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, prototyping, and S/TEM sample preparation. With a range of models with ESEM technology and two DualBeam™ systems.
Featured Instruments
The new FEI Nova NanoSEM 30 Series brings superior low voltage resolution and high surface sensitivity imaging to the Nova Family of Ultra high Resolution Field Emission Scanning Electron Microscopes (UhR FE-SEM). A Schottky emitter allows for high stability emission and high current modes while the immersion lens optimizes secondary electron collection. Additionally, the new Nova NanoSEM features a helix detector that delivers high resolution images in low vacuum as well as at low kV.
Advantages and Capabilities
The Nova NanoSEM tools are ultra-high resolution FEG-SEMs with the world's only high-resolution, low-vacuum imaging capabilities for spectacular nanoscale characterization on charging and/or contaminating nanotech materials. The Nova NanoSEMs are available in three different stage sizes: 6" (150mm), 4" (100mm) or 2" (50mm).